关键词: 缺陷预测, 软件测试, 软件度量

Abstract: In defect prediction models built on software product metrics, metrics are usually collected from two levels: class/file and package/component. It is shown to all that at package-level better recall and precision can be achieved while at class-level the prediction is more efficient. This paper tries to combine the metrics and prediction results of the class-level and package-level. By adding the information of package-level prediction to the class-level, the problem domain, which may determine the defects, is taken into account. To evaluate the effectiveness of the proposed method, the paper carries an experiment study on Eclipse3.0 open source code, and compares it with the class-level result. The results show that the new method can improve the recall from 5% to 8%, and when half of the defects are checked, 3.6% to 9.84% less lines of codes can be read.

Key words: defect prediction, software testing, software metrics