使用EBIC的软件故障特征选择方法
涂吉屏，钱晔，王炜，范道远，张涵宇
Approach to Software Defect Features Selection Using Extended Bayesian Information Criterion
TU Jiping, QIAN Ye, WANG Wei, FAN Daoyuan, ZHANG Hanyu
计算机科学与探索
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2020, (2): 215
-235
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DOI: 10.3778/j.issn.1673-9418.1810047
